Test Optimization in Production through the Use of Boundary Scan

View our latest webinar recording on “Test Optimization in Production – Reduction of Test Time through the Use of Boundary Scan” to learn how you can reduce test time and complex interface hardware through the use of JTAG/Boundary Scan. While Boundary Scan as a test methodology has been around for more than 25 years, its advantages for production test often are still underestimated.
And, over the years this technology has seen a lot of innovation.

Designers and test planners alike are confronted with the same problem: to ensure sufficient test access despite increasing miniaturization and simultaneous increase in functionality and complexity of modern electronics.
“Every circuit node needs a test point!” Many of you have heard this statement. But this is no longer possible on modern electronics. Join us in this webinar to learn about powerful and cost saving methods to utilize boundary-scan and related technologies in manufacturing test.

Topics that will be addressed during the webinar:

  • “JTAG / Boundary Scan” nowadays is much more than just connectivity test.
  • Utilize the UUT’s FPGA or microprocessor as an embedded test system.
  • Testing that previously required high numbers of test probes can still be done when physical external access is no longer possible.

 

Target audience:  Test engineers, test managers, production engineers, production managers, CEOs, contract designers and contract manufacturers, design engineers and design managers.

 

Level:  Beginners and advanced users.

 

This webinar was originally presented on November 3, 2015.

Feel free to view the webinar recording by following this link

High-speed programming with RAPIDO

This short video shows RAPIDO in action: high-speed programming on up to 32 boards in parallel. For more details, visit http://www.goepelusa.com/model/rapido/.

 

This video has been recorded at electronica 2014 in Munich, Germany, demonstrating high-speed in-system programming and boundary-scan testing of ten boards in parallel. In actual use, RAPIDO would be used in-line in the manufacturing environment.

Details and product brief can be found on GOEPEL’s website. Or, simply send us your inquiry.

New mixed-signal JTAG I/O module

CION LX module FXT96

CION LX module FXT96

At International Test Conference (ITC) 2014 in Seattle, GOEPEL Electronics introduced the CION-LX Module/FXT96, a new mixed-signal JTAG I/O module enabling boundary-scan based tests to non scannable circuit components such as connectors, clusters, or analog interfaces.

Read the rest of this entry »

World’s Most Widely Used JTAG/Boundary Scan Products Available in the USA

Timeline of design for test (DFT) standards and GOEPEL’s product innovationsGOEPEL Electronics, the industry’s number one provider of JTAG and boundary scan related test products, used worldwide by top PCB manufacturers, is available and in wide distribution in the USA. While GOEPEL is not yet as well known in the USA as some of it’s competitors, the company has long led the field in development and distribution of it’s award winning product line.

Read the rest of this entry »

What is “JTAG”?

When most test or design engineers hear “JTAG”, many things may come to mind.  The acronym itself stands for Joint Test Action group — a user group who initialized the IEEE 1149.1 standard, also known as boundary scan.  However, since its inception as the first sanctioned IEEE test standard, JTAG has evolved to embody a variety of applications not included in the originally drafted IEEE 1149.1 standard.  Nowadays, the JTAG term is not very straightforward and often ambiguous.  Today, the JTAG interface is utilized for a range of applications.

Below are some common JTAG applications:

Read the rest of this entry »