Everything you need to know about embedded real-time functional test

Can you imagine an embedded diagnostic operating system suitable for use in lab and production; capable of performing both at-speed / real-time diagnostic functional tests and high-speed in-system flash programming?

Intrigued? Attend our upcoming webinar on January 26th, at 11 AM EST, 8 AM PST (16:00 UTC).

Read the rest of this entry »

GOEPEL presents Embedded System Access (ESA) Technology at ITC 2015

Key elements of current & future Application Specific Standard Product (ASSP) designs include large, fast memory, (multi-) core processors, wired and/or wireless networking, high-speed communication interfaces, graphical control and display features, as well as sensors and actors (MEMS). All of these elements require advanced test techniques, if for no other reasons than diminishing test access:

paradigm change - transparent

 

GOEPEL presents a number of test techniques under the umbrella of Embedded System Access (ESA) technologies at this year’s International Test Conference (ITC) in Anaheim, CA. Visit us at booth #219 to learn more about technologies for high-speed memory test, high-speed in-system programming, FPGA assisted testing, processor emulation test, and embedded real-time diagnostics.

New mixed-signal JTAG I/O module

CION LX module FXT96

CION LX module FXT96

At International Test Conference (ITC) 2014 in Seattle, GOEPEL Electronics introduced the CION-LX Module/FXT96, a new mixed-signal JTAG I/O module enabling boundary-scan based tests to non scannable circuit components such as connectors, clusters, or analog interfaces.

Read the rest of this entry »

GOEPELUSA.com Redesigned

As you may have noticed, we have redesigned our website www.goepelusa.com.

While we think that the new design is a vast improvement, and new features such as the product finder, site search, and site wide registration for downloads will be very useful, we are keen to hear from you and get feedback about what you think of the redesign and of the content of our website.
Read the rest of this entry »

Author: Admin Posted in: Events, General information, News
Comments: Leave a Comment

GOEPEL and SiliconAid join forces to provide Chip Level Debug in Board and System Environments

GOEPEL Electronics announces joint developments with SiliconAid Solutions in the area of chip level debug in board and system environments. GOEPEL and SiliconAid personnel were present at ITC in Anaheim, CA, last week to discuss details of these developments and the benefits of leveraging both technologies together.

Read the rest of this entry »