SJTAG starts activities as IEEE sponsored study group

The SJTAG initiative has been granted Study Group status by IEEE’s TTSC. Please join the study group if you are interested in the prospect of standardizing system test access management.

Call for participation:


This is a call for participation in the “System Test Access Management” Study Group (also referred to as ‘SJTAG’). Those interested in joining the study group or being kept informed of its activities should notify their interest by email to or via the group’s Contact Page (

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Everything you need to know about embedded real-time functional test

Can you imagine an embedded diagnostic operating system suitable for use in lab and production; capable of performing both at-speed / real-time diagnostic functional tests and high-speed in-system flash programming?

Intrigued? Attend our upcoming webinar on January 26th, at 11 AM EST, 8 AM PST (16:00 UTC).

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GOEPEL presents Embedded System Access (ESA) Technology at ITC 2015

Key elements of current & future Application Specific Standard Product (ASSP) designs include large, fast memory, (multi-) core processors, wired and/or wireless networking, high-speed communication interfaces, graphical control and display features, as well as sensors and actors (MEMS). All of these elements require advanced test techniques, if for no other reasons than diminishing test access:

paradigm change - transparent


GOEPEL presents a number of test techniques under the umbrella of Embedded System Access (ESA) technologies at this year’s International Test Conference (ITC) in Anaheim, CA. Visit us at booth #219 to learn more about technologies for high-speed memory test, high-speed in-system programming, FPGA assisted testing, processor emulation test, and embedded real-time diagnostics.

New mixed-signal JTAG I/O module

CION LX module FXT96

CION LX module FXT96

At International Test Conference (ITC) 2014 in Seattle, GOEPEL Electronics introduced the CION-LX Module/FXT96, a new mixed-signal JTAG I/O module enabling boundary-scan based tests to non scannable circuit components such as connectors, clusters, or analog interfaces.

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As you may have noticed, we have redesigned our website

While we think that the new design is a vast improvement, and new features such as the product finder, site search, and site wide registration for downloads will be very useful, we are keen to hear from you and get feedback about what you think of the redesign and of the content of our website.
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