The SJTAG initiative has been granted Study Group status by IEEE’s TTSC. Please join the study group if you are interested in the prospect of standardizing system test access management.
Call for participation:
This is a call for participation in the “System Test Access Management” Study Group (also referred to as ‘SJTAG’). Those interested in joining the study group or being kept informed of its activities should notify their interest by email to firstname.lastname@example.org or via the group’s Contact Page (http://www.sjtag.org/members/contact-us).
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View our latest webinar recording on “Test Optimization in Production – Reduction of Test Time through the Use of Boundary Scan” to learn how you can reduce test time and complex interface hardware through the use of JTAG/Boundary Scan. While Boundary Scan as a test methodology has been around for more than 25 years, its advantages for production test often are still underestimated.
And, over the years this technology has seen a lot of innovation.
Designers and test planners alike are confronted with the same problem: to ensure sufficient test access despite increasing miniaturization and simultaneous increase in functionality and complexity of modern electronics.
“Every circuit node needs a test point!” Many of you have heard this statement. But this is no longer possible on modern electronics. Join us in this webinar to learn about powerful and cost saving methods to utilize boundary-scan and related technologies in manufacturing test.
Topics that will be addressed during the webinar:
- “JTAG / Boundary Scan” nowadays is much more than just connectivity test.
- Utilize the UUT’s FPGA or microprocessor as an embedded test system.
- Testing that previously required high numbers of test probes can still be done when physical external access is no longer possible.
Target audience: Test engineers, test managers, production engineers, production managers, CEOs, contract designers and contract manufacturers, design engineers and design managers.
Level: Beginners and advanced users.
This webinar was originally presented on November 3, 2015.
Feel free to view the webinar recording by following this link…
This short video shows RAPIDO in action: high-speed programming on up to 32 boards in parallel. For more details, visit http://www.goepelusa.com/model/rapido/.
This video has been recorded at electronica 2014 in Munich, Germany, demonstrating high-speed in-system programming and boundary-scan testing of ten boards in parallel. In actual use, RAPIDO would be used in-line in the manufacturing environment.
Details and product brief can be found on GOEPEL’s website. Or, simply send us your inquiry.