View our latest webinar recording on “Test Optimization in Production – Reduction of Test Time through the Use of Boundary Scan” to learn how you can reduce test time and complex interface hardware through the use of JTAG/Boundary Scan. While Boundary Scan as a test methodology has been around for more than 25 years, its advantages for production test often are still underestimated.
And, over the years this technology has seen a lot of innovation.
Designers and test planners alike are confronted with the same problem: to ensure sufficient test access despite increasing miniaturization and simultaneous increase in functionality and complexity of modern electronics.
“Every circuit node needs a test point!” Many of you have heard this statement. But this is no longer possible on modern electronics. Join us in this webinar to learn about powerful and cost saving methods to utilize boundary-scan and related technologies in manufacturing test.
Topics that will be addressed during the webinar:
- “JTAG / Boundary Scan” nowadays is much more than just connectivity test.
- Utilize the UUT’s FPGA or microprocessor as an embedded test system.
- Testing that previously required high numbers of test probes can still be done when physical external access is no longer possible.
Target audience: Test engineers, test managers, production engineers, production managers, CEOs, contract designers and contract manufacturers, design engineers and design managers.
Level: Beginners and advanced users.
This webinar was originally presented on November 3, 2015.
Feel free to view the webinar recording by following this link…