Can you imagine an embedded diagnostic operating system suitable for use in lab and production; capable of performing both at-speed / real-time diagnostic functional tests and high-speed in-system flash programming?
Intrigued? Attend our upcoming webinar on January 26th, at 11 AM EST, 8 AM PST (16:00 UTC).
GÖPEL electronic has developed a technology named JEDOS which delivers these exact capabilities. In our webinar you will discover the motivation for the development of JEDOS and learn more about the concept of “inside-out-testing”.
We will discuss a number of currently available test features and demonstrate the generation of functional tests through a graphical user interface.
Questions that will be addressed in this webinar:
- What information is required for test generation?
- Do I need special firmware on the unit under test?
- What exactly can be tested?
- What test coverage can I achieve with JEDOS?
- What diagnostic information is generated by JEDOS?
When: January 26, 2016, 11 AM EST (8 AM PST, 16:00 UTC)
Speaker: Ricardo Wenzel, SW Developer and Product Manager JEDOS, GOEPEL electronic GmbH
Moderator: Matthias Mueller, GOEPEL electronic GmbH
The webinar is directed at design engineers, quality and production managers for printed circuit board assemblies, technologists and production planners, as well as CEOs and directors of companies in the electronics industry.
Join this webinar free of charge. Register now …
Missed it? Contact us to request access to the recording and/or to get more information.